The grid resistance switching unit cetisPV-GR is an add-on to our Photovoltaic Curve Tracer cetisPV-CTL1. It allows the measurement of grid printing resistances on the cell surface as well as and contacting resistances. It can be used in laboratory and production environments. For high accuracy the resistance measurement is accomplished as an IV-sweep. The analysis is done by linear regression.
Features:
Measurement of grid resistance (transverse resistance) between two or three front bus bars. This gives additional information about the quality of the cell front printing and firing process. With three bus bars all combinations of bus bars (bus bar 1 to 2, bus bar 2 to 3 and bus bar 1 to 3) can be evaluated.
Measurement of metallization resistance (transverse resistance) of the rear side of the cell between two or three contact bars. This gives additional information about the quality of the cell rear printing and firing process. With tree bus bars all combinations of bus bars (bus bar 1 to 2, bus bar 2 to 3 and bus bar 1 to 3) can be evaluated.
Measurement of contact resistance between the current and voltage contacts of each contact bar. The evaluation can be done for each contact bar separately (maximal 3 front side contact bars and 3 rear side contact bars). High contact resistance values are evidence for bad contact positioning or bad (or missing) contact pattern of the cell.
Measurement of isolation resistance between the current and voltage path of each bus bar between the cell contacting cycles. This is especially useful, to detect isolation problems in Kelvin contacts.
Inline capability. Not more than 100 milliseconds are needed for all measurements (grid, metallization and contact resistance). The evaluated resistance values can be used for cell classification. They can be written to the database and can be exported to MES systems.
Easy integration in a sorter environment. No extra contacting station or other mechanical components are needed.