SNEC Conference on June 5, 2019
Learn more about h.a.l.m.'s new innovations at the SNEC conference 2019.
Dr. Klaus Ramspeck will present "Flasher integrated electroluminescence measurements - automatic defect recognition and combined analysis with IV-measurement data"
Date and place: June 5, 2019 at 2pm in Kerry Hotel Pudong, Shanghai, Function Room 3